1900s

“Microstructure, Electrical Properties, and Thermal Stability of Ti-based Ohmic Contacts to n-GaN,”
L.L. Smith, R.F. Davis, R.-J. Liu, M.J. Kim and R.W. Carpenter,
J. Mater. Res. 14, 1032 (1999).

“Microstructure of TiN Ohmic Contacts on n-GaN,”
R.-J. Liu, R.W. Carpenter and M.J. Kim,
Microsc. Micronanal. 5 (Suppl. 2), 130 (1999).

“Heterogeneous Formation of Oriented Silicon Oxynitride on a-Si3N4 Seed Crystals: Habits and Radiation Stability,”
R.W. Carpenter, W. Braue and M.J. Kim,
Microsc. Microanal. 5 (Suppl. 2), 778 (1999).

“Microstructure of Au/Ti Ohmic Contacts on n-GaN,”
R.-J. Liu, L.L. Smith, M.J. Kim, R.W. Carpenter and R.F. Davis,
Microsc. Microanal. 4 (Suppl. 2), 668 (1998).

“Microstructure and NOx Gas-sensing Characteristics of WO3Thin-film sensors,”
K.S. Yoo, Y.J. Oh, T.S. Kim, H.J. Jung, M.J. Kim, Y.W. Shin and J.B. Wagner, Jr.,
Proc. 3rd East Asia Conf. Chemical Sensors, Seoul, Korea, 158 (1997).

“Microstructure, Electrical Properties, and Thermal Stability of Au-Based Contacts to p-GaN,”
L.L. Smith, R.F. Davis, M.J. Kim, R.W. Carpenter and Y. Huang,
J. Mater. Res. 12, 2249 (1997).

“Interface Synthesis by UHV Deposition/Diffusion Bonding,”
M.J. Kim, M.J. Cox and J. Xu,
Mater. Res. Soc. Symp. 458, 327 (1997).

“Chemically Clean Planar Interface Synthesis: Substrate Surface and Interface Cross Section Microscopy,”
J. Xu, M.J. Cox and M.J. Kim,
Microsc. Microanal. 3 (Suppl. 2), 635 (1997).

“Microstructure of Cr-B Ohmic and Rectifying Contacts on (0001) 6H-SiC,”
R.-J. Liu, L.M. Porter, M.J. Kim, R.W. Carpenter, and R.F. Davis,
Microsc. Microanal. 3 (Suppl. 2), 641 (1997).

“Interfacial Segregation in Al-Cu-Mg Alloys,”
R.G. Ford, R.W. Carpenter, M.J. Kim and K. Sieradzki,
Microsc. Microanal. 3 (Suppl. 2), 547 (1997).

“Microstructure, Electrical Properties, and Thermal Stability of Al Ohmic Contacts to n-GaN,”
L.L. Smith, R.F. Davis, M.J. Kim, R.W. Carpenter and Y. Huang,
J. Mater. Res. 11, 2257 (1996).

“Influence of Interfacial Copper During the Dealloying and Nitridation of Cu-Ti Thin Films,”
T.L. Alford, Daniel Adams, N.D. Theodore, T. Laursen and M.J. Kim,
Mater. Chem. Phys. 46, 248 (1996).

“Formation of Passivation and Adhesion Layers for Cu via Nitridation of Cu-Ti in an Ammonia Ambient,”
D. Adams, T.L. Alford, S.A. Rafalski, M.J. Rack, S.W. Russell, M.J. Kim and J.W. Mayer,
Materials Chemistry and Physics 43, 145 (1996).

“Crystallographic Origin of the Alternate Bright/Dark Contrast in 6H-SiC and Other Hexagonal Crystal HREM Images,”
J.S. Bow, R.W. Carpenter and M.J. Kim,
J. Micros. Soc. Amer. 2, 63 (1996).

“Local Chemistry at Interfaces and Boundaries: Ceramics and Electronic Composite Materials,”
R.W. Carpenter, J.S. Bow, M.J. Kim, K. Das Chowdhury and W. Braue,
Microsc. Microanal. 6, 587 (1995).

“Chemistry, Microstructure, and Electrical Properties at Interfaces between Thin Films of Platinum and Alpha (6H) Silicon Carbide (0001),”
L.M. Porter, R.F. Davis, J.S. Bow, M.J. Kim and R.W. Carpenter,
J. Mater. Res. 10, 2336 (1995).

“Chemistry, Microstructure, and Electrical Properties at Interfaces between Thin Films of Titanium and Alpha (6H) Silicon Carbide (0001),”
L.M. Porter, R.F. Davis, J.S. Bow, M.J. Kim and R.W. Carpenter,
J. Mater. Res. 10, 668 (1995).

“Chemistry, Microstructure, and Electrical Properties at Interfaces between Thin Films of Cobalt and Alpha (6H) Silicon Carbide (0001),”
L.M. Porter, R.F. Davis, J.S. Bow, M.J. Kim and R.W. Carpenter,
J. Mater. Res. 10, 26 (1995).

“Retention of Nanostruture in Aluminum Oxide by Very Rapid Sintering at 1150°C,”
S.H. Risbud, C-H. Shan, A.K. Mukherjee, M.J. Kim, J.S. Bow and R.A. Holl,
J. Mater. Res. 10, 237 (1995).

“Structure and Chemistry of Nb/Sapphire Interfaces, With and Without Interlayers of Sb and Cr,”
J. Yuan, V. Gupta and M.J. Kim,
Acta Metall. Mater. 43, 769 (1995).

“Chemical Widths at Composite Interfaces: Relationships to Structural Widths and Methods for Measurement,”
R.W. Carpenter, J.S. Bow, M.J. Kim, K. Das Chowdhury and W. Braue,
Mater. Res. Soc. Symp. 357, 271 (1995).

“An HREM Study of the Microstructure of Al Contact on GaN/AlN/SiC Thin Films,”
Y. Huang, L. Smith, M.J. Kim, R.W. Carpenter and R.F. Davis,
Mater. Res. Soc. Symp. 355, 433 (1995).

“HRTEM and AEM Study of (Au, TiN) Thin Film on (100) Silicon,”
J.S. Bow, Y.C. Hung, M.J. Kim, R.W. Carpenter, W.M. Kim, S.K. Lee and S.G. Kim,
Proc. 53rd Annual MSA Meeting, Kansas City, MS, 554 (1995).

“Nanostructure and Chemical Inhomogeneity in TbFe Magneto-Optical Films,”
M.J. Kim, J.S. Bow, R.W. Carpenter, J. Liu, S.G. Kim, S.K. Lee, W.M. Kim and J.S. Yoon,
IEEE Trans. Magnetics 30, 4398 (1994).

“Clean Grain Boundaries in Aluminum Nitride Densified Without Additives by a Plasma Activated Sintering Process,”
S.H. Risbud, J. Groza and M.J. Kim,
Phil. Mag. 69, 525 (1994).

“Thin Film Ti/6H-SiC interfacial reaction: High Resolution Electron Microscopy Study,”
J.S. Bow, L.M. Porter, M.J. Kim, R.W. Carpenter and R.F. Davis,
Ultramicroscopy 52, 289 (1994).

“Quantitative Analysis of Silicon Oxides Using EELS,”
M.J. Kim, Proc. 52nd Annual MSA Meeting,
New Orleans, LA, 986 (1994).

“Deposition and Characterization of Schottky and Ohmic Contacts on n-type Alpha 6H-SiC (0001),”
L.M. Porter, R.F. Davis, J.S. Bow, M.J. Kim and R.W. Carpenter,
Inst. Phys. Conf. Ser. 137, 581 (1994).

“Chemical Heterogeneity in TbFe Sputtered Films for Magneto-Optical Recording,”
M.J. Kim, J.S. Bow, R.W. Carpenter, B.J. Barry, S.K. Lee, S.G. Kim, W.M. Kim and J.S. Yoon,
Electron Microscopy ICEM 13, 1183 (1994).

“HREM Image Simulation of Ti5Si3/TiC/6H-SiC Interfaces,”
J.S. Bow, R.W. Carpenter and M.J. Kim,
Proc. 52nd Annual MSA Meeting, New Orleans, LA, 518 (1994).

“Electron Microscopy Evidence for Microsegregation in TbFe Sputtered Films for Magneto-Optical Recording,”
M.J. Kim, J.S. Bow, R.W. Carpenter, S.G. Kim, S,K. Lee,  W.M. Kim and J.S. Yoon,
ODS Tech. Digest Ser. 10, 153 (1994).

“The Composition and Structure of SIPOS: A High Spatial Resolution Electron Microscopy Study,”
M. Catalano, M.J. Kim, R.W. Carpenter, K. DasChowdhury and J. Wong,
J. Mater. Res. 8, 2893 (1993).

“Atomic Scale Analysis for Interfaces in Electronic and Structural Composites,”
M.J. Kim,
Proc. International Conference for Advancement of Science and Technology, Seoul, Korea, 1217 (1993).

“High Spatial Resolution TEM for Material Research,”
M.J. Kim,
Ceramics Monthly 6, 80 (1993).

“Chemical and Electrical Mechanisms in Titanium, Platinum, and Hafnium Contacts to Alpha (6H) Silicon Carbide,”
L.M. Spellman, R.C. Glass, J.S. Bow, M.J. Kim, R.W. Carpenter and R.F. Davis,
Mater. Res. Soc. Symp. 282, 471 (1993).

“High Spatial Resolution TEM Study of Thin Film Metal/6H-SiC Interfaces,”
J.S. Bow, L.M. Spellman, M.J. Kim, R.W. Carpenter and R.F. Davis,
Mater. Res. Soc. Symp. 280, 571 (1993).

“Origin of the Alternate Bright/Dark Contrast in HREM Images of Hexagonal Crystals, Particularly 6H-SiC,”
J.S. Bow, R.W. Carpenter and M.J. Kim,
Proc. 51st Annual EMSA Meeting, Cincinnati, OH, 914 (1993).

“HREM and AEM Study of Pt/SiC Interface Annealed at High Temperature,”
J.S. Bow, L.M. Porter, M.J. Kim, R.W. Carpenter and R.F. Davis,
Proc. 51st Annual EMSA Meeting, Cincinnati, OH, 832 (1993).

“CBED Study of Low Temperature InP Grown by Gas Source MBE,”
R. Rajesh, M.J. Kim, J.S. Bow, R.W. Carpenter, G.N. Maracas,
Proc. 51st Annual EMSA Meeting, Cincinnati, OH, 810 (1993)

“Preparation of Thin-Film Metal/6H-SiC TEM Specimens by RPR Ion Milling,”
J.S. Bow, F. Shaapur, M.J. Kim and R.W. Carpenter,
Proc. 51st Annual EMSA Meeting, Cincinnati, OH, 714 (1993)

“Cross-sectional TEM Specimen Preparation from Magneto-Optical Disk by Ultramicrotomy,”
F. Shaapur, M.J. Kim, S.K. Lee and S.G. Kim,
Proc. 51st Annual EMSA Meeting, Cincinnati, OH, 236 (1993)

“Structure and Precipitation on a S=13 Tilt Grain Boundary in Silicon,”
M.J. Kim, R.W. Carpenter, Y.L. Chen and G.H. Schwuttke,
Ultramicroscopy 40, 258 (1992).

“Analysis of Interfaces by the Fresnel Fringe Technique,”
K. DasChowdhury, R.W. Carpenter and M.J. Kim,
Microscopy: The Key Research Tool 22, 61 (1992).

“Growth and Characterization of Low Temperature InP by Gas Source MBE,”
G.N. Maracas, K.T. Shiralagi, R.A. Pechner, F. Yu, K.T. Choi, J.S. Bow, R. Ramamurti, M.J. Kim and R.W. Carpenter,
Mater. Res. Soc. Symp. 241, 271 (1992).

“High Resolution Analysis of Structure and Chemistry of Grain Boundaries in Silicon,”
M.J. Kim and R.W. Carpenter,
Mater. Res. Soc. Symp. 238, 157 (1992).

“HREM of Low Temperature InP Grown by Gas Source MBE,”
R, Rajesh, M.J. Kim, J.S. Bow, R.W. Carpenter and G.N. Maracas,
Proc. 50th Annual EMSA Meeting, Boston, MA, 1380 (1992).

“HREM Study of the Ti/6H-SiC Interface,”
J.S. Bow, L.M. Spellman, M.J. Kim, R.W. Carpenter and R.F. Davis,
Proc. 50th Annual EMSA Meeting, Boston, MA, 252 (1992).

“Quantum Molecular Dynamics Simulation of S13 Grain Boundary in Si,”
M.J. Kim, H. Ma, R.W. Carpenter, S.H. Lin and O.F. Sankey,
Proc. 50th Annual EMSA Meeting, Boston, MA, 212 (1992).

“Microstructure and Properties of Al-Cu-Li-Ag-Mg-Zr Alloy,”
M.J. Kim, C.S. Lee, M. Catalano and K.S. Shin,
Proc. 50th Annual EMSA Meeting, Boston, MA, 184 (1992).

“HRAEM Analysis of Nanostructure of Semiconductor Quantum Dots in a Borosilicate Glass Matrix,”
L.C. Liu, M.J. Kim, S.H. Risbud and R.W. Carpenter,
Phil. Mag. 6, 769 (1991).

“Extrinsic Gettering of Copper in Silicon: Heterogeneous Precipitation on Dislocations,”
P.M. Rice, M.J. Kim and R.W. Carpenter,
Mater. Res. Soc. Symp. 209, 385 (1991).

“High Spatial Resolution Electron Microscopy Study of Semi-insulating Polycrystalline Silicon,”
M. Catalano, M.J. Kim, R.W. Carpenter and J. Wong,
18th Congresso della Societa’ Italiana di Microscopia Elettronica, Padova, Italy, 211 (1991).

“Comparative Oxidation Studies of Polycrystalline HP and CVD Silicon Carbides by TEM,”
J.S. Bow, M.J. Kim and R.W. Carpenter,
Proc. 49th Annual EMSA Meeting, San Jose, CA, 938 (1991).

“Analysis of Pure Tilt Grain Boundary in Silicon by Fresnel Fringe Technique,”
K. DasChowdhury, M.J. Kim, Y.L. Chen and R.W. Carpenter,
Proc. 49th Annual EMSA Meeting, San Jose, CA, 1002 (1991).

“Microstructure of Silicon Implanted with MeV Gold Ions,”
M.J. Kim, M. Catalano, T.P. Sjoreen and R.W. Carpenter,
Proc. 49th Annual EMSA Meeting, San Jose, CA, 876 (1991).

“Analysis of 2-D and 3-D Defects Associated with Precipitation of Cu in Silicon,”
P.M. Rice, M.J. Kim and R.W. Carpenter,
Proc. 49th Annual EMSA Meeting, San Jose, CA, 870 (1991).

“Microanalysis of High Dose Oxygen Implanted Germanium,”
M.J. Kim, Q. Zhang, K. DasChowdhury, R.W. Carpenter and J.C. Kelly,
Proc. 49th Annual EMSA Meeting, San Jose, CA, 866 (1991).

“Nanoanalysis of Impurity Precipitation on Grain Boundaries in Polysilicon,”
M.J. Kim, R.W. Carpenter, D.K. Schroder and J.H. Wohlgemuth,
Proc. 26th Annual MAS Meeting, San Jose, CA, 483 (1991).

“Nanoanalysis of Semi-Insulating Polycrystalline Silicon by High Spatial Resolution Electron Microscopy,”
M. Catalano, M.J. Kim, R.W. Carpenter and J. Wong,
Proc. 26th Annual MAS Meeting, San Jose, CA, 449 (1991).

“Precipitation, Interlayers and Segregation at Interfaces: Which High Resolution Method,”
R.W. Carpenter, K. DasChowdhury and M.J. Kim,
Proc. 26th Annual MAS Meeting, San Jose, CA, 242 (1991).

“Nanostructure of Semiconducting Quantum Dots in a Borosilicate Glass Matrix by Complementary Use of HREM and AEM,”
M.J. Kim, L.C. Liu, S.H. Risbud and R.W. Carpenter,
Electron Microscopy 4, 728 (1990).

“S=13 Tilt Grain Boundary in Silicon Bicrystal,”
M.J. Kim, Y.L. Chen, R.W. Carpenter, J.C. Barry and G.H. Schwuttke,
Electron Microscopy 4, 562 (1990).

“Copper Precipitation on Extrinsic Defects in Silicon,”
P.M. Rice, M.J. Kim and R.W. Carpenter,
Electron Microscopy 4, 652 (1990).

“Composition and Structure of Native Oxide on Silicon by High Resolution Analytical Electron Microscopy,”
M.J. Kim and R.W. Carpenter,
J. Mater. Res. 5, 347 (1990).

“Advances in Microscopy of Processed Semiconductors: Nanospectroscopy,”
R.W. Carpenter, Y.L. Chen, M.J. Kim and J.C. Barry,
Inst. Phys. Conf. Ser. 100, 543 (1989).

“Microanalysis of a Thin Native Oxide Layer on Silicon Surfaces by Parallel EELS,”
M.J. Kim and R.W. Carpenter,
Proc. 47th Annual EMSA Meeting, San Antonio, Texas, 224 (1989).

“Gold-Silicon Interfaces: Reactions, Precipitation and Subsurface Gettering,”
R.W. Carpenter and M.J. Kim,
Mater. Res. Soc. Sym. 104, 153 (1988).

“TEM Specimen Heating During Ion Beam Thinning: Microstructural Instability,”
M.J. Kim and R.W. Carpenter,
Ultramicroscopy 21, 327 (1987).

“TEM Study of Gold Precipitation on Defects in Silicon,”
M.J. Kim and R.W. Carpenter,
Proc. 45th Annual EMSA Meeting, Baltimore, MD, 240 (1987).

“High Resolution EM Study of the Gold Silicon Interface Reaction,”
M.J. Kim, R.W. Carpenter and J.C. Barry,
Proc. 44th Annual EMSA Meeting, Albuquerque, NM, 406 (1986).