“In-situ TEM Observation on Nanostructure Evolution During Electrical Testing,”
J. Kim, K.J. Choi, D.K. Cha, M.J. Kim, S.M. Yoon and B.G. Yu,
Non-Volatile Memory Technology Symposium 2007, NVMTS ’07, 79-81, (2007).

“Fabrication of Three-dimensional Devices with Various Nano Components Using a Combination of a FIB System and Nano Manipulation,”
J.B. Jeon, J. Lee, D.K. Cha, T.H. Lee, J. Wang and M.J. Kim,
Microsc. Microanal. 13(Suppl. 2), 1514-1515CD (2007).

“HRTEM Study on the Interface of Si-based Resonant Tunneling Diodes (RTD) by UHV Wafer Bonding Technology,”
T.H. Lee, D.K. Cha, J.G. Wang, J.B. Jeon, J. Kim, R.M. Wallace, B.E. Gnade and M.J. Kim,
Microsc. Microanal. 13(Suppl. 2), 804-805CD (2007).

“Determination of Strain in the Silicon Channel Induced by a Metal Electrode,”
H.C. Floresca, J.G. Wang, M.J. Kim, C.Y. Kang, R. Choi, S.C. Song, H.H. Tseng, B.H. Lee and R. Jammy,
Microsc. Microanal. 13(Suppl. 2), 838-839CD (2007).

“Fabrication and Characterization of Single Nanowire and Nanotube Devices,”
D.K. Cha, B. Lee, J.B. Jeon, J. Kim and M.J. Kim,
Microsc. Microanal. 13(Suppl. 2), 720-721CD (2007).

“TEM-EELS Study on the Ash Damage and Repair of Porous Low-k Films,”
J. Wang, D.K. Cha, P.M. Matz, C.E. Smith, D.W. Mueller, R.F. Reidy and M.J. Kim,
Microsc. Microanal. 13(Suppl. 2), 794-795CD (2007).

“Effects of Metal Gate-induced Strain on the Performance of Metal-oxide-semiconductor Field Effect Transistors with Titanium Nitride Gate Electrode and Hafnium Oxide Dielectric,”
C.Y. Kang, R. Choi, M.M. Hussain, J. Wang, Y.J. Suh, H.C. Floresca, M.J. Kim, J. Kim, B.H. Lee and R. Jammy,
Appl. Phys. Lett. 91, 033511-3 (2007).

” A Novel Bonding Method for Ionic Wafers,”
M.M.R. Howlader, T. Suga and M.J. Kim,
IEEE Trans. Advanced Packaging 30, 598-604 (2007).

“Synthesis of Silver Nanoplates at High Yields by Slowing Down the Polyol Reduction of Silver Nitrate with Polyacrylamide,”
Y. Xing, A.R. Siekkinen, J. Wang, Y. Yin, M.J. Kim and Y. Xia,
J. Mater. Chem. 17, 2600-2602 (2007).

“Effect of Composition on the Thermal Stability of Sputter Deposited Hafnium Aluminate and Nitrided Hafnium Aluminate Dielectrics on Si(100),”
P. Sivasubramani, J. Kim, M.J. Kim, B.E. Gnade and R.M. Wallace,
J. Appl. Phys. 101, 114108-1-4 (2007).

“Synthesis and Mechanistic Study of Palladium Nanobars and Nanorods,”
Y.J. Xiong, H.G. Cai, B.J. Wiley, J.G. Wang, M.J. Kim and Y.N. Xia,
J. Am. Chem. Soc. 129, 3665-3675 (2007).

“Microstructure Characterization for Nano-thick Ir-inserted Nickel Silicides,” O.S. Song, K. Yoon, T.H. Lee and M.J. Kim,
Kor. J. Mater. Res. 17, 125-132 (2007)

“Thermal stability studies of fully silicided NiSi on Si-oxynitride and Hf-based high-k gate stacks,”
P. Zhao, M. J. Kim, B. E. Gnade, and R. M. Wallace,
J. Appl. Phys. 101, 053504-1-6(2007).